Work

Spectroscopic ellipsometry of Si1−xGex epilayers of arbitrary composition 0≤x≤0.255

Year: 1994

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.110823

Authors: R. T. Carline, C. Pickering, D. J. Robbins, W. Y. Leong, A. D. Pitt, A. G. Cullis

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2000807500

FWCI: 4.173

Cites: 14

Cited by: 38

Related to: 10