A Bayesian Scheme to Detect Changes in the Mean of a Short-Run Process
Year: 2005
Type: article
Source: Technometrics
Authors: Panagiotis Tsiamyrtzis, Douglas M Hawkins
Language: English
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Open Access status: closed
Funder: National Science Foundation
OpenAlex ID: W2000884317
