Variable temperature Raman microscopy as a nanometrology tool for graphene layers and graphene-based devices
Year: 2007
Type: article
Abstract: Raman microscopy of graphene was carried out over the temperature range from 83to373K. The number of layers was independently confirmed by the quantum Hall measurements and atomic force microscopy. The values of the temperature coefficients for the G and 2D-band frequencies extracted from Raman spectra of the single-layer graphene are −(1.6±0.2)×10−2cm−1∕K and −(3.4±0.4)×10−2cm−1∕K, respectively. The G peak temperature coefficients of the bilayer graphene and bulk graphite are −(1.5±0.06)×10−2cm−1∕K and −(1.1±0.04)×10−2cm−1∕K, respectively. The results are important for the application of Raman microscopy as a nanometrology tool for the graphene-based devices operating at various temperatures.
Source: Applied Physics Letters
DOI: 10.1063/1.2771379
Authors: I. Calizo, F. Miao, W. Bao, C. N. Lau, A. A. Balandin
Institution: University of California, Riverside
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2001369917