Crystal Orientation of BiSrCaCuO (11n) Thin Films Determined by X-ray Asymmetric Reflection
Year: 1991
Type: article
Abstract: Tilt angles of the c-axes from the substrate surface of BiSrCaCuO (11n) thin films were precisely measured using a diffractometer method with X-ray asymmetric reflection. The preferred orientation was determined from the measurement of these angles. The high T c phase composition film formed on a SrTiO3 (110) substrate had two tilt angles of 45.24° and 45.04°, and their preferred orientation was (1110), while the low T c phase composition film had a tilt angle of 41.2° and the preferred orientation was (117). We also performed a precise measurement for a low T c phase composition film formed on a SrTiO3 (110) 5° off substrate and found that its tilt angle was 45.4°.
DOI: 10.1143/jjap.30.2477
Authors: Masayuki Kataoka, Ken'ichi Kuroda, Junji Tanimura, Osamu Wada, Kazuyoshi Kojima, Tetsuya Takami, Koichi Hamanaka, Tetsuo Ogama Tetsuo Ogama
Institution: Mitsubishi Electric (Japan)
Language: English
Subfield: Condensed Matter Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W2001588371