Work

Polarized EXAFS, distance-valence least-squares modeling (DVLS), and quantitative texture analysis approaches to the structural refinement of Garfield nontronite

Year: 1998

Type: article

Source: Physics and Chemistry of Minerals

DOI: 10.1007/s002690050125

Authors: A. Manceau, D. Chateigner, W. P. Gates

Institutions: Centre National de la Recherche Scientifique, Université Joseph Fourier, Institut des Sciences de la Terre

Language: English

Topic: X-ray Spectroscopy and Fluorescence Analysis

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2001920899

FWCI: 6.792

Cites: 41

Cited by: 164

Related to: 10