Work

Single atom image contrast: conventional dark‐field and bright‐field electron microscopy

Year: 1975

Type: article

Abstract: Single atom inage intensities are calculated for bright-field and various dark-field modes, including the ideal beam stop, a wire beam stop, tilted illumination and a displaced aperture. Comparisons of scattering amplitudes and elastic scattering cross-sections are made with different object potentials and scattering formulations. The image contrast for one mercury atom (Z equals 80) on a column of carbon atoms (Z equals 6) as the substrate is also discussed for both the bright-field and the various dark-field situations.

Source: Journal of Microscopy

DOI: 10.1111/j.1365-2818.1975.tb04535.x

Authors: Wah Chiu, Robert M. Glaeser

Institutions: Lawrence Berkeley National Laboratory, University of California, Berkeley

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: green

OpenAlex ID: W2002529700

FWCI: 0.832

Cites: 21

Cited by: 17

Related to: 10