Work

An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes

Year: 1962

Type: article

Source: Solid-State Electronics

DOI: 10.1016/0038-1101(62)90111-9

Author: L.M. Terman

Institution: IBM (United States)

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2002765787

FWCI: 24.34

Cites: 10

Cited by: 1,459

Related to: 9