Work

Can applied science be ‘good science’? Exploring the relationship between patent citations and citation impact in nanoscience

Year: 2010

Type: article

Source: Scientometrics

DOI: 10.1007/s11192-009-0154-3

Authors: M. Meyer, K. Debackere, W. Glänzel

Institutions: University of Sussex, KU Leuven

Language: English

Topic: scientometrics and bibliometrics research

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: green

OpenAlex ID: W2003094673

FWCI: 6.562

Cites: 49

Cited by: 59

Related to: 10