Work

Pulsed laser atom probe analysis of semiconductor materials

Year: 1986

Type: article

Source: Journal of Microscopy

DOI: 10.1111/j.1365-2818.1986.tb02712.x

Authors: A. Cerezo, C. R. M. Grovenor, G. D. W. Smith

Institution: University of Oxford

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2003280023

FWCI: 6.006

Cites: 32

Cited by: 61

Related to: 10