ON-state reliability of amorphous-silicon antifuses
Year: 1998
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.368884
Authors: N. Vasudevan, R. B. Fair, H. Z. Massoud, T. Zhao, K. Look, Y. Karpovich, M. J. Hart
Institutions: Duke University, Xilinx (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2003845686