Work

Characterization and Experimental Assessment of the Effects of Parasitic Elements on the MOSFET Switching Performance

Year: 2012

Type: article

Source: IEEE Transactions on Power Electronics

DOI: 10.1109/tpel.2012.2195332

Authors: Jianjing Wang, Henry Shu-hung Chung, River Tin-ho Li

Institutions: City University of Hong Kong, ABB (Switzerland)

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2003935246

FWCI: 8.008

Cites: 13

Cited by: 573

Related to: 10