Work

Disorder and defects in sputtered a-SiH from subgap absorption measurements

Year: 1985

Type: article

Source: Solid State Communications

DOI: 10.1016/0038-1098(85)90844-0

Authors: D. Jousse, E. Bustarret, F. Boulitrop

Institutions: Centre National de la Recherche Scientifique, Technicolor (France)

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2004200517

FWCI: 4.32

Cites: 16

Cited by: 41

Related to: 10