Year: 2009
Type: conference-paper
Abstract: Cavities of coalesced voids have been found in recovered samples of Tantalum in high‐explosive‐driven experiments. The boundaries of these cavities are imprinted with details of the coalescence and void growth processes. One way of quantifying these details is to measure the roughness of the surfaces. In this work, we calculate the roughness of 2D cross sections of such cavity surfaces from micrographs by analyzing the images with the box counting technique. Spall plane damage driven by flyer plates in Copper samples is also analyzed. The different length scale regimes found will be discussed.
Source: AIP conference proceedings
DOI: 10.1063/1.3294989
Institutions: Los Alamos National Laboratory, Arizona State University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2004380722