Work

Differential Fault Analysis on the Families of SIMON and SPECK Ciphers

Year: 2014

Type: conference-paper

Source: Workshop on Fault Diagnosis and Tolerance in Cryptography

DOI: 10.1109/fdtc.2014.14

Authors: Harshal Tupsamudre, Shikha Bisht, Debdeep Mukhopadhyay

Institution: Indian Institute of Technology Kharagpur

Language: English

Topic: Cryptographic Implementations and Security

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2004715563

FWCI: 4.648

Cites: 11

Cited by: 67

Related to: 10