Principles and methods of testing finite state machines-a survey
Year: 1996
Type: article
Source: Proceedings of the IEEE
DOI: 10.1109/5.533956
Authors: D. Lee, M. Yannakakis
Institution: AT&T (United States)
Language: English
Subfield: Software
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2004929506