Qualitative Properties For A Sixth Order Thin Film Equation
Work
Year: 2010
Type: article
Abstract: In this article, the author studies the qualitative properties of weak solutions for a sixth‐order thin film equation, which arises in the industrial application of the isolation oxidation of silicon.... more
Author Changchun Liu
Institution Jilin University
Cites: 18
Cited by: 9
Related to: 10
FWCI: 1.496
Citation percentile (by year/subfield): 72.01
Subfield: Computational Mechanics
Field: Engineering
Domain: Physical Sciences
Sustainable Development Goal Industry, innovation and infrastructure
Open Access status: hybrid
APC paid (est):