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Compatibility testing using patterns-based trace comparison

Year: 2014

Type: conference-paper

Source: IEEE/ACM International Conference on Automated Software Engineering (ASE)

DOI: 10.1145/2642937.2642942

Authors: Venkatesh-Prasad Ranganath, Pradip Vallathol, Pankaj Gupta

Institutions: Kansas State University, University of Wisconsin–Madison, Microsoft (United States)

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2005587558

FWCI: 0.173

Cites: 23

Cited by: 3

Related to: 10