Resolution enhancement of nondestructive testing from B‐scans
Year: 2012
Type: article
DOI: 10.1002/ima.22021
Authors: Hsin M. Shieh, Hsin‐Chun Yu, Yu‐Ching Hsu, Ruei Yu
Institutions: Feng Chia University, Tunghai University
Language: English
Subfield: Mechanics of Materials
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2005744125
