Work

Statistical descriptors in crystallography: Report of the IUCr Subcommittee on Statistical Descriptors

Year: 1989

Type: article

Abstract: The Subcommittee has attempted to elucidate the nature of problems encountered in the definition and use of statistical descriptors as applied to crystallography and to propose procedural improvements. The report contains (a) a dictionary of statistical terms established for use by experimentalists; (b) a description of the statistical basis for refinement procedures; (c) sections dealing with defects in the physical model used for refinement, and with the choice and significance of weighting schemes; and (d) recommendations, some of which may be readily implemented, whilst others may require a long-term effort to bring them into general use.

Source: Acta Crystallographica Section A Foundations of Crystallography

DOI: 10.1107/s0108767388009596

Authors: D. Schwarzenbach, S. C. Abrahams, H. D. Flack, W. Gonschorek, Th. Hahn, K. Huml, R. E. Marsh, E. Prince, B. E. Robertson, J. S. Rollett, A. J. C. Wilson

Institutions: University of Lausanne, AT&T (United States), University of Geneva, International Union of Crystallography, University of Regina, Czech Academy of Sciences, Czech Academy of Sciences, Institute of Macromolecular Chemistry, University of Oxford

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W2006037732

FWCI: 0.844

Cites: 23

Cited by: 75

Related to: 10