Work

Friction measurements on phase-separated thin films with a modified atomic force microscope

Year: 1992

Type: article

Source: Nature

DOI: 10.1038/359133a0

Authors: R. M. Overney, E. Meyer, J. Frommer, D. Brodbeck, R. Lüthi, L. Howald, H.-J. Giintherodt, M. Fujihira, H. Takano, Y. Gotoh

Institutions: University of Basel, IBM (United States), IBM Research - Almaden, Tokyo Institute of Technology

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2006267303

FWCI: 21.39

Cites: 36

Cited by: 524

Related to: 10