Work

Expanding needs for metrological traceability and measurement uncertainty

Year: 2013

Type: article

Source: Measurement

DOI: 10.1016/j.measurement.2013.04.046

Author: H. Imai

Institutions: National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology

Language: English

Topic: Scientific Measurement and Uncertainty Evaluation

Subfield: Instrumentation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2006622082

FWCI: 3.937

Cites: 1

Cited by: 18

Related to: 10