Work

Effect of grain boundary on electrical properties of polycrystalline lanthanum nickel oxide thin films

Year: 2012

Type: article

Source: Applied Physics A

DOI: 10.1007/s00339-012-7466-5

Authors: M. W. Zhu, Z. J. Wang, Y. N. Chen, H. L. Wang, Z. D. Zhang

Institutions: Chinese Academy of Sciences, Institute of Metal Research, Shenyang National Laboratory for Materials Science

Language: English

Topic: Magnetic and transport properties of perovskites and related materials

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2007530926

FWCI: 0.361

Cites: 30

Cited by: 16

Related to: 10