Work

Measurement of Q degradation due to polarisation mode dispersion using multiple importance sampling

Year: 2003

Type: article

Source: Electronics Letters

DOI: 10.1049/el:20030650

Authors: L.-S. Yan, M.C. Hauer, P. Ebrahimi, Y. Wang, Y.Q. Shi, X. Steve Yao, A.E. Willner, W.L. Kath

Institutions: University of Southern California, Northwestern University

Language: English

Topic: Optical Network Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2007658701

FWCI: 1.338

Cites: 5

Cited by: 4

Related to: 10