Work

Biological applications of microscope profiler

Year: 2007

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.756806

Authors: Sen Han, Erik Novak, Jason Reed, Michael Teitell, James Gimzewski

Institutions: Veeco (United States), University of California, Los Angeles

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2008098145

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