Work

Localized Defects in Semiconductors

Year: 1967

Type: article

Source: Physical Review

DOI: 10.1103/physrev.156.860

Authors: Joseph Callaway, A. James Hughes

Institutions: University of California, Riverside, Philco-Ford (United States)

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2008353088

FWCI: 8.319

Cites: 21

Cited by: 175

Related to: 10