Work

Real-time monitoring of Si1–xGex heteroepitaxial growth using laser light scattering and spectroscopic ellipsometry

Year: 1995

Type: article

Source: physica status solidi (a)

DOI: 10.1002/pssa.2211520110

Authors: C. Pickering, R. T. Carline, D. A. O. Hope, D. J. Robbins

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2008701023

FWCI: 0.985

Cites: 10

Cited by: 4

Related to: 10