Work

Constant‐Distance Mode Scanning Electrochemical Microscopy (SECM)—Part I: Adaptation of a Non‐Optical Shear‐Force‐Based Positioning Mode for SECM Tips

Year: 2003

Type: article

Source: Chemistry - A European Journal

DOI: 10.1002/chem.200204267

Authors: Bernardo Ballesteros Katemann, Albert Schulte, Wolfgang Schuhmann

Institution: Ruhr University Bochum

Language: English

Topic: Electrochemical Analysis and Applications

Subfield: Electrochemistry

Field: Chemistry

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2009183165

FWCI: 5.05

Cites: 76

Cited by: 161

Related to: 10