Work

Monitoring technology trends through patent analysis: a case study of thin film

Year: 2001

Type: article

Source: Research Evaluation

DOI: 10.3152/147154401781777187

Authors: Sujit Bhattacharya, Moh'd Taiyab Rashid Khan

Language: English

Topic: Intellectual Property and Patents

Subfield: Management of Technology and Innovation

Field: Business, Management and Accounting

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2009385045

FWCI: 2.258

Cites:

Cited by: 15

Related to: 10