Work

Spectrum analysis of surface roughness signals obtained with the scanning tunneling microscope

Year: 1987

Type: article

Source: Surface Science

DOI: 10.1016/0039-6028(87)90166-x

Authors: J. Valdés, E. Lobbe, M. Porfiri

Institution: National Institute of Industrial Technology

Language: English

Topic: Surface Roughness and Optical Measurements

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2009575555

FWCI: 0.511

Cites: 3

Cited by: 2

Related to: 10