Work

Analysis and evaluation of uniformity of SWIR InGaAs FPA – Part II: Processing issues and overall effects

Year: 2013

Type: article

Source: Infrared Physics & Technology

DOI: 10.1016/j.infrared.2013.01.010

Authors: Cheng Li, Yong-gang Zhang, Yi Gu, Kai Wang, Xiang Fang, Xue Li, Hao-si-bai-yin Li

Institutions: Chinese Academy of Sciences, Shanghai Institute of Microsystem and Information Technology, State Key Laboratory of Functional Materials for Informatics

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2010042433

FWCI: 0.399

Cites: 11

Cited by: 7

Related to: 10