Work

Nanoscale Mechanical Characterization Using Atomic Force Microscopy

Year: 2007

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927607072017

Authors: M Falvo, R Superfine, S Washburn, S Lord, A Hall, L Jawerth

Institutions: University of North Carolina at Chapel Hill, Harvard University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2010926930

FWCI:

Cites:

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