Strained Si, SiGe, and Ge channels for high-mobility metal-oxide-semiconductor field-effect transistors
Year: 2004
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.1819976
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2011042741
