Work

Evaluation of reflection intensities for the components of multiple Laue diffraction spots by direct methods

Year: 1993

Type: article

Source: Acta Crystallographica Section A Foundations of Crystallography

DOI: 10.1107/s0108767392012182

Authors: Q. Hao, J. W. Campbell, M. M. Harding, J. R. Helliwell

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2011705778

FWCI: 1.069

Cites: 1

Cited by: 12

Related to: 10