Work

Using radial basis function neural networks to recognize shifts in correlated manufacturing process parameters

Year: 1998

Type: article

Source: IIE Transactions

DOI: 10.1080/07408179808966453

Authors: DEBORAH F. COOK, CHIH-CHOU CHIU

Institutions: Virginia Tech, Fu Jen Catholic University

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2011926415

FWCI: 3.878

Cites: 37

Cited by: 82

Related to: 10