Work

Force dependences for the definition of the atomic force microscopy spatial resolution

Year: 1988

Type: article

Source: Physics Letters A

DOI: 10.1016/0375-9601(88)90868-7

Authors: Yu.N. Moiseev, V.M. Mostepanenko, V.I. Panov, I.Yu. Sokolov

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2012402161

FWCI: 0.909

Cites: 8

Cited by: 57

Related to: 10