Year: 1992
Type: article
Abstract: A general introduction to X-ray diffraction and its application to the study of surfaces and interfaces is presented. The application of X-ray diffraction to various problems in surface and interface science is illustrated through five different techniques: crystal truncation rod analysis; two-dimensional crystallography; three-dimensional structure analysis; the evanescent wave method; and lineshape analysis. These techniques are explained with numerous examples from experiments and with the aid of an extensive bibliography.
Source: Reports on Progress in Physics
Authors: I K Robinson, D J Tweet
Institution: AT&T (United States)
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W2012460201