Year: 2003
Type: article
Abstract: Dephasing in a ballistic four-terminal Aharonov-Bohm geometry due to charge and voltage fluctuations is investigated. Treating two terminals as voltage probes, we find a strong dependence of the dephasing rate on the probe configuration in agreement with a recent experiment by Kobayashi, Aikawa, Katsumoto, and Iye [J. Phys. Soc. Jpn. 71, 2094 (2002)]. Voltage fluctuations in the measurement circuit are shown to be the source of the configuration dependence.
Authors: G. Seelig, S. Pilgram, A. N. Jordan, M. Büttiker
Institution: University of Geneva
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2012610016