Work

Failure analysis of odd/even word-line failure to improve the endurance performance of a NAND Flash

Year: 2009

Type: conference-paper

Source: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

DOI: 10.1109/ipfa.2009.5232715

Authors: Young Sun, Mark Zhang, Jossen Yu, Walden Dong, Wei-Ting Kary Chien

Institution: Semiconductor Manufacturing International (China)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2012703382

FWCI:

Cites: 30

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Related to: 10