Work

Sensitivity increase for coating thickness determination using THz waveguides

Year: 2010

Type: article

Abstract: We report on layer thickness determination down to a thickness of 2.5 microns using terahertz waveguide spectroscopy. Compared to typical single-pass transmission measurements in the time domain, the effective THz pulse delay is considerably increased for a given layer thickness by using the high filling factor of the THz waveguide. This corresponds to a sensitivity increase up to a factor of 50 for the measured delay, allowing the direct measurement of layer thicknesses down to below hundredths of a THz wavelength.

Source: Optics Express

DOI: 10.1364/oe.18.011456

Authors: M. Theuer, R. Beigang, D. Grischkowsky

Institutions: Oklahoma State University, Fraunhofer Institute for Physical Measurement Techniques

Language: English

Topic: Terahertz technology and applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: gold

Estimated APC paid: $2,270

Funder: National Science Foundation