Work

Radiation-induced Soft Errors: A Chip-level Modeling Perspective

Year: 2010

Type: article

Source: Foundations and Trends® in Electronic Design Automation

DOI: 10.1561/1000000018

Author: Norbert Seifert

Institution: Intel (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2014215998

FWCI: 2.734

Cites: 135

Cited by: 29

Related to: 10