Work

Metrology of gan electronics using micro-raman spectroscopy

Year: 2008

Type: dissertation

Source: SMARTech Repository (Georgia Institute of Technology)

Author: Thomas E. Beechem

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2014543030

Cites: 193

Cited by: 11

Related to: 10