Work

Self-referenced quantitative phase microscopy

Year: 2012

Type: conference-paper

Abstract: Self-referenced quantitative phase microscopy (SrQPM) is reported, wherein quantitative phase imaging is achieved through the interference of the sample wave with a reflected version of itself. The off-axis interference between the two beams generates a spatially modulated hologram that is analyzed to quantify the sample's amplitude and phase profile. SrQPM requires approximately one-half of the object field of view to be empty and optically flat, which serves as a reference for the other half of the field of view containing the sample.

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.909701

Authors: Timothy R. Hillman, Niyom Lue, Yongjin Sung, Ramachandra R. Dasari, Peter T. C. So, Zahid Yaqoob

Institution: Massachusetts Institute of Technology

Language: English

Topic: Digital Holography and Microscopy

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W2015012313

FWCI: 1.181

Cites: 29

Cited by: 1

Related to: 10