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Blackbox Identity Testing for Bounded Top-Fanin Depth-3 Circuits: The Field Doesn't Matter
Work
Year: 2012
Type: article
Abstract: Let $C$ be a depth-3 circuit with $n$ variables, degree $d$, and top-fanin $k$ (called ${\Sigma\Pi\Sigma}(k,d,n)$ circuits) over base field ${\mathbb{F}}$. It is a major open problem to design a deter... more
Cites: 16
Cited by: 41
Related to: 10
FWCI: 3.746
Citation percentile (by year/subfield): 93.84
Open Access status: green