Work

Biometric perils and patches

Year: 2002

Type: article

Source: Pattern Recognition

DOI: 10.1016/s0031-3203(01)00247-3

Authors: Ruud M. Bolle, Jonathan H. Connell, Nalini K. Ratha

Institution: IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Biometric Identification and Security

Subfield: Signal Processing

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2015867063

FWCI: 16.06

Cites: 14

Cited by: 328

Related to: 10