Work

Focused ion beam Moiré method

Year: 2003

Type: article

Source: Optics and Lasers in Engineering

DOI: 10.1016/s0143-8166(02)00099-4

Authors: Huimin Xie, Biao Li, Robert Geer, Bai Xu, James Castracane

Institutions: Tsinghua University, University at Albany, State University of New York

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Ministry of Education of the People's Republic of China

OpenAlex ID: W2016125075

FWCI: 1.089

Cites: 11

Cited by: 33

Related to: 10