Surface profile measurement using chromatic confocal microscopy
Year: 2004
Type: conference-paper
DOI: 10.1117/12.571595
Authors: Kebin Shi, Peng Li, Shizhuo Yin, Zhiwen Liu
Institution: Pennsylvania State University
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2016339593