Toward a secure batch verification with group testing for VANET
Year: 2013
Type: article
Source: Wireless Networks
Authors: Cheng-Chi Lee, Yan-Ming Lai
Institution: Fu Jen Catholic University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: National Science Council
OpenAlex ID: W2016358833
