Work

Scanning Auger microscopy of corroded SiC

Year: 1986

Type: article

Source: Journal of Materials Science Letters

DOI: 10.1007/bf01742219

Authors: R. Browning, J. Smialek, N. Jacobson

Institutions: Ames Research Center, National Aeronautics and Space Administration, Glenn Research Center

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2017493514

FWCI: 1.569

Cites: 5

Cited by: 7

Related to: 10