Work

Transmission electron microscopy of the formation of nickel silicides

Year: 1982

Type: article

Source: Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties

DOI: 10.1080/01418618208243901

Authors: H. Föll, P. S. Ho, K. N. Tu

Institutions: Siemens (Germany), IBM (United States), IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: Office of Naval Research

OpenAlex ID: W2017497809

FWCI: 8.606

Cites: 15

Cited by: 137

Related to: 10