Work

High spatial resolutions of diffraction information in large-angle convergent-beam electron diffraction patterns from cross-sectional specimens of GexSi1-x/Si strained-layer superlattices

Year: 1993

Type: conference-abstract

Source: Acta Crystallographica Section A Foundations of Crystallography

DOI: 10.1107/s0108767378090054

Authors: X. F. Duan, D. Cherns, J. W. Steeds

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: bronze

OpenAlex ID: W2017499376

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